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  1. University of Yangon
  2. Department of Physics

Characterization and Dielectric Properties of LaMnO3 Thin Films by Spin Coating Method

http://hdl.handle.net/20.500.12678/0000002407
http://hdl.handle.net/20.500.12678/0000002407
77f8399c-97cc-4f6e-912a-a85bc226c083
b3e53bcb-ed10-423a-902c-277b23f1d24a
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Characterization Characterization and Dielectric Properties by Dr.Zin Min Myat.pdf (303 Kb)
Publication type
Journal article
Upload type
Publication
Title
Title Characterization and Dielectric Properties of LaMnO3 Thin Films by Spin Coating Method
Language en
Publication date 2016
Authors
Ko Ko Kyaw Soe
Zin Min Myat
Pwint Yee Thein
Than Than Win
Yin Maung Maung
Description
This paper presents LaMnO3 nanostructured thin
films were deposited on silicon substrate by using Single
Wafer Spin Processor. LaMnO3 powder was firstly prepared
by pyrolysis method. The structural, morphology and thermal
properties of LMO powder was examined by XRD, SEM and
TG-DTA. The films obtained from spin coating technique
have been annealed at 500 ºC and 600 ºC for 1 h. Morphology,
and structural properties of fabricated LaMnO3 thin films
were investigated by SEM and XRD analysis. The objective
of this research is to explore the structure, dielectric properties
and processing of thin films that contain nanoscale embedded
hard particles.
Keywords
LaMnO3 power
Identifier http://uyr.uy.edu.mm/handle/123456789/39
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