{"_buckets": {"deposit": "125f0bc6-a2c4-4919-8631-26880d044ec0"}, "_deposit": {"created_by": 184, "id": "7765", "owner": "184", "owners": [184], "owners_ext": {"displayname": "", "username": ""}, "pid": {"revision_id": 0, "type": "depid", "value": "7765"}, "status": "published"}, "_oai": {"id": "oai:meral.edu.mm:recid/00007765", "sets": ["user-mtlu"]}, "communities": ["mtlu"], "item_1583103067471": {"attribute_name": "Title", "attribute_value_mlt": [{"subitem_1551255647225": "Structural and Electrical Properties of Fluorine Doped Nanocrystalline Tin Oxide Thin Film", "subitem_1551255648112": "en"}]}, "item_1583103085720": {"attribute_name": "Description", "attribute_value_mlt": [{"interim": "The application of thin film technology is entirely entered into all branches of science and technology. Fluorine doped tin oxide thin films belong to a special class of metal oxide thin film, nanostructure thin film solar cell.  Fluorine doped tin oxide thin films prepared on glass substrate by sol-gel dip-coating method. The effect of dopant concentration of ammonium fluoride and heat treatment temperature of SnO2:F films on structural, surface morphology and electrical properties were investigated. The X-ray diffraction analysis of all SnO2:F films indicated the tetragonal structure of tin oxide with polycrystalline nature. The SEM micrographs of the SnO2:F films showed tetragonal crystal structure (flower like shape) and uniform surface pattern, at the optimized heat treated temperature  400 ºC. The best results were obtained the doping concentration of 7.5 % w/w ammonium fluoride at the heat treated temperature 400 ºC with the electrical resistance of 3.71 Ωsq-1 ."}]}, "item_1583103108160": {"attribute_name": "Keywords", "attribute_value_mlt": [{"interim": "SnO2:F thin film"}, {"interim": "dip-coating"}, {"interim": "tetragonal"}, {"interim": "polycrystalline"}]}, "item_1583103120197": {"attribute_name": "Files", "attribute_type": "file", "attribute_value_mlt": [{"accessrole": "open_access", "date": [{"dateType": "Available", "dateValue": "2021-01-25"}], "displaytype": "preview", "download_preview_message": "", "file_order": 0, "filename": "Khin Moh Moh Hlaing, Dr.pdf", "filesize": [{"value": "28.7 MB"}], "format": "application/pdf", "future_date_message": "", "is_thumbnail": false, "licensetype": "license_0", "mimetype": "application/pdf", "size": 28700000.0, "url": {"url": "https://meral.edu.mm/record/7765/files/Khin Moh Moh Hlaing, Dr.pdf"}, "version_id": "532bc8f1-026f-48a9-a7a4-6012e50cf84d"}]}, "item_1583103131163": {"attribute_name": "Journal articles", "attribute_value_mlt": [{"subitem_issue": "I", "subitem_journal_title": "Meiktila University Research Journal,2020, Vol.XI, No.1", "subitem_pages": "220-224", "subitem_volume": "XI"}]}, "item_1583105942107": {"attribute_name": "Authors", "attribute_value_mlt": [{"subitem_authors": [{"subitem_authors_fullname": "Khin Moh Moh Hlaing, Dr"}, {"subitem_authors_fullname": "Hlaing Hlaing Oo, Dr"}, {"subitem_authors_fullname": "Ni Ni Aung, Dr"}, {"subitem_authors_fullname": "Mya Hinn Aye Khaing, Dr"}]}]}, "item_1583108359239": {"attribute_name": "Upload type", "attribute_value_mlt": [{"interim": "Publication"}]}, "item_1583108428133": {"attribute_name": "Publication type", "attribute_value_mlt": [{"interim": "Journal article"}]}, "item_1583159729339": {"attribute_name": "Publication date", "attribute_value": "2020-08-31"}, "item_title": "Structural and Electrical Properties of Fluorine Doped Nanocrystalline Tin Oxide Thin Film", "item_type_id": "21", "owner": "184", "path": ["1608242063591", "1608715460334"], "permalink_uri": "http://hdl.handle.net/20.500.12678/0000007765", "pubdate": {"attribute_name": "Deposited date", "attribute_value": "2021-01-25"}, "publish_date": "2021-01-25", "publish_status": "0", "recid": "7765", "relation": {}, "relation_version_is_last": true, "title": ["Structural and Electrical Properties of Fluorine Doped Nanocrystalline Tin Oxide Thin Film"], "weko_shared_id": -1}